{"id":3701,"date":"2023-01-23T13:43:12","date_gmt":"2023-01-23T11:43:12","guid":{"rendered":"https:\/\/gaz-temporal.i3a.es\/?p=3701"},"modified":"2023-01-24T11:23:05","modified_gmt":"2023-01-24T09:23:05","slug":"ruben-gran-tejero","status":"publish","type":"post","link":"https:\/\/gaz.i3a.es\/es\/ruben-gran-tejero\/","title":{"rendered":"Rub\u00e9n Gran Tejero"},"content":{"rendered":"<div id=\"pl-gb3701-69eca48e1c0ff\"  class=\"panel-layout\" ><div id=\"pg-gb3701-69eca48e1c0ff-0\"  class=\"panel-grid panel-has-style\" ><div class=\"siteorigin-panels-stretch panel-row-style panel-row-style-for-gb3701-69eca48e1c0ff-0\" data-stretch-type=\"full-width-stretch\" ><div id=\"pgc-gb3701-69eca48e1c0ff-0-0\"  class=\"panel-grid-cell\" ><div id=\"panel-gb3701-69eca48e1c0ff-0-0-0\" class=\"so-panel widget widget_sow-hero panel-first-child panel-last-child\" data-index=\"0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-hero so-widget-sow-hero-default-93415d0e2dbf-3701 so-widget-fittext-wrapper\"\n\t\t\t data-fit-text-compressor=\"0.85\"\n\t\t>\t\t\t\t<div class=\"sow-slider-base\" style=\"display: none\" tabindex=\"0\">\n\t\t\t\t\t<ul\n\t\t\t\t\tclass=\"sow-slider-images\"\n\t\t\t\t\tdata-settings=\"{&quot;pagination&quot;:true,&quot;speed&quot;:800,&quot;timeout&quot;:8000,&quot;paused&quot;:false,&quot;pause_on_hover&quot;:false,&quot;swipe&quot;:true,&quot;nav_always_show_desktop&quot;:&quot;&quot;,&quot;nav_always_show_mobile&quot;:&quot;&quot;,&quot;breakpoint&quot;:&quot;780px&quot;,&quot;unmute&quot;:false,&quot;anchor&quot;:null}\"\n\t\t\t\t\t\t\t\t\t\tdata-anchor-id=\"\"\n\t\t\t\t>\t\t<li class=\"sow-slider-image\" style=\"visibility: visible;;background-color: #1e73be\" >\n\t\t\t\t\t<div class=\"sow-slider-image-container\">\n\t\t\t<div class=\"sow-slider-image-wrapper\">\n\t\t\t\t<h3 style=\"text-align: center\"><a href=\"..\/team\/\">Investigadores<\/a><\/h3>\n<h1 style=\"text-align: center\"><strong>Rub\u00e9n Gran Tejero<\/strong><\/h1>\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<\/li>\n\t\t<\/ul>\t\t\t\t<ol class=\"sow-slider-pagination\">\n\t\t\t\t\t\t\t\t\t\t\t<li><a href=\"#\" data-goto=\"0\" aria-label=\"mostrar diapositiva 1\"><\/a><\/li>\n\t\t\t\t\t\t\t\t\t<\/ol>\n\n\t\t\t\t<div class=\"sow-slide-nav sow-slide-nav-next\">\n\t\t\t\t\t<a href=\"#\" data-goto=\"next\" aria-label=\"diapositiva siguiente\" data-action=\"next\">\n\t\t\t\t\t\t<em class=\"sow-sld-icon-thin-right\"><\/em>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\n\t\t\t\t<div class=\"sow-slide-nav sow-slide-nav-prev\">\n\t\t\t\t\t<a href=\"#\" data-goto=\"previous\" aria-label=\"diapositiva anterior\" data-action=\"prev\">\n\t\t\t\t\t\t<em class=\"sow-sld-icon-thin-left\"><\/em>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div><\/div><\/div><\/div><\/div><\/div><\/div>\n\n<div id=\"pl-gb3701-69eca48e1cac9\"  class=\"panel-layout\" ><div id=\"pg-gb3701-69eca48e1cac9-0\"  class=\"panel-grid panel-no-style\" ><div 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class=\"so-panel widget widget_sow-image-grid panel-first-child\" data-index=\"1\" ><div class=\"panel-widget-style panel-widget-style-for-gb3701-69eca48e1cac9-0-1-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-image-grid so-widget-sow-image-grid-default-5ff4073610f5-3701\"\n\t\t\t\n\t\t>\t<div\n\t\tclass=\"sow-image-grid-wrapper\"\n\t\t\t\t\t>\n\t\t\t\t\t<div class=\"sow-image-grid-image\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<a href=\"https:\/\/dblp.org\/pid\/92\/864.html\"\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\ttarget=\"_blank\" \t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\trel=\"noopener noreferrer\" \t\t\t\t\t\t\t\t\t\t\t>\n\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"37\" height=\"37\" src=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2023\/01\/dblp_icon.png\" class=\"sow-image-grid-image_html\" alt=\"\" title=\"\" srcset=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2023\/01\/dblp_icon.png 37w, https:\/\/gaz.i3a.es\/wp-content\/uploads\/2023\/01\/dblp_icon-12x12.png 12w\" sizes=\"auto, (max-width: 37px) 100vw, 37px\" \/>\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<div class=\"sow-image-grid-image\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<a href=\"http:\/\/webdiis.unizar.es\/~rgran\/\"\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\ttarget=\"_blank\" \t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\trel=\"noopener noreferrer\" \t\t\t\t\t\t\t\t\t\t\t>\n\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"37\" height=\"37\" src=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2020\/10\/web.png\" class=\"sow-image-grid-image_html\" alt=\"\" title=\"\" srcset=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2020\/10\/web.png 37w, https:\/\/gaz.i3a.es\/wp-content\/uploads\/2020\/10\/web-12x12.png 12w\" sizes=\"auto, (max-width: 37px) 100vw, 37px\" \/>\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<div class=\"sow-image-grid-image\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<a href=\"https:\/\/scholar.google.es\/citations?user=za6dIeEAAAAJ&#038;hl=es\"\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\ttarget=\"_blank\" \t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\trel=\"noopener noreferrer\" \t\t\t\t\t\t\t\t\t\t\t>\n\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"37\" height=\"37\" src=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2020\/10\/google-scholar.png\" class=\"sow-image-grid-image_html\" alt=\"\" title=\"\" srcset=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2020\/10\/google-scholar.png 37w, https:\/\/gaz.i3a.es\/wp-content\/uploads\/2020\/10\/google-scholar-12x12.png 12w\" sizes=\"auto, (max-width: 37px) 100vw, 37px\" \/>\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<div class=\"sow-image-grid-image\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<a href=\"https:\/\/www.researchgate.net\/profile\/Ruben-Gran-Tejero\"\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\ttarget=\"_blank\" \t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\trel=\"noopener noreferrer\" \t\t\t\t\t\t\t\t\t\t\t>\n\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"37\" height=\"37\" src=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2023\/01\/researchgate_icon.png\" class=\"sow-image-grid-image_html\" alt=\"\" title=\"\" srcset=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2023\/01\/researchgate_icon.png 37w, https:\/\/gaz.i3a.es\/wp-content\/uploads\/2023\/01\/researchgate_icon-12x12.png 12w\" sizes=\"auto, (max-width: 37px) 100vw, 37px\" \/>\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<div class=\"sow-image-grid-image\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<a href=\"https:\/\/orcid.org\/0000-0002-4031-5651\"\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\ttarget=\"_blank\" \t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\trel=\"noopener noreferrer\" \t\t\t\t\t\t\t\t\t\t\t>\n\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"37\" height=\"37\" src=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2023\/01\/orcid_icon.png\" class=\"sow-image-grid-image_html\" alt=\"\" title=\"\" srcset=\"https:\/\/gaz.i3a.es\/wp-content\/uploads\/2023\/01\/orcid_icon.png 37w, https:\/\/gaz.i3a.es\/wp-content\/uploads\/2023\/01\/orcid_icon-12x12.png 12w\" sizes=\"auto, (max-width: 37px) 100vw, 37px\" \/>\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t<\/div>\n<\/div><\/div><\/div><div id=\"panel-gb3701-69eca48e1cac9-0-1-1\" class=\"so-panel widget widget_sow-editor panel-last-child\" data-index=\"2\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<p><strong>Senior Lecturer<\/strong><\/p>\n<p><strong>Email:<\/strong> <a href=\"mailto:rgran@unizar.es\">rgran@unizar.es<\/a><\/p>\n<p><strong>Address:<\/strong> Campus R\u00edo Ebro, University of Zaragoza<br \/>\nC\/Mar\u00eda de Luna 1, Ada Byron Building,<br \/>\n50018, Zaragoza, Spain<\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div>\n\n<div id=\"pl-gb3701-69eca48e1f4ef\"  class=\"panel-layout\" ><div id=\"pg-gb3701-69eca48e1f4ef-0\"  class=\"panel-grid panel-has-style\" ><div class=\"panel-row-style panel-row-style-for-gb3701-69eca48e1f4ef-0\" ><div id=\"pgc-gb3701-69eca48e1f4ef-0-0\"  class=\"panel-grid-cell\" ><div id=\"panel-gb3701-69eca48e1f4ef-0-0-0\" class=\"so-panel widget widget_sow-headline panel-first-child\" data-index=\"0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-headline so-widget-sow-headline-default-244eb6bef45a-3701\"\n\t\t\t\n\t\t><div class=\"sow-headline-container\">\n\t\t\t\t\t\t\t<h5 class=\"sow-headline\">\n\t\t\t\t\t\tABOUT ME\t\t\t\t\t\t<\/h5>\n\t\t\t\t\t\t\t\t\t\t\t<div class=\"decoration\">\n\t\t\t\t\t\t<div class=\"decoration-inside\"><\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n<\/div><\/div><div id=\"panel-gb3701-69eca48e1f4ef-0-0-1\" class=\"so-panel widget widget_sow-editor panel-last-child\" data-index=\"1\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<p>Rub\u00e9n Gran Tejero graduated in Computer Science from the University of Zaragoza, Spain. He received his Ph.D. from the Polytechnic University of Catalonia (UPC), Spain, in 2010. Since 2010, he has been an Associate Professor at the Department of Computer Science and Systems Engineering, University of Zaragoza. His research interests include hard real-time systems, hardware for reducing worst-case execution time and energy consumption, efficient processor microarchitecture, and effective programming for parallel and heterogeneous systems. Dr. Gran Tejero is member of the Aragon Institute of Engineering Research (I3A) and the Spanish Society of Computer Architecture (SARTECO).<\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><div id=\"pg-gb3701-69eca48e1f4ef-1\"  class=\"panel-grid panel-has-style\" ><div class=\"panel-row-style panel-row-style-for-gb3701-69eca48e1f4ef-1\" ><div id=\"pgc-gb3701-69eca48e1f4ef-1-0\"  class=\"panel-grid-cell\" ><div id=\"panel-gb3701-69eca48e1f4ef-1-0-0\" class=\"so-panel widget widget_sow-headline panel-first-child\" data-index=\"2\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-headline so-widget-sow-headline-default-244eb6bef45a-3701\"\n\t\t\t\n\t\t><div class=\"sow-headline-container\">\n\t\t\t\t\t\t\t<h5 class=\"sow-headline\">\n\t\t\t\t\t\tPUBLICATIONS\t\t\t\t\t\t<\/h5>\n\t\t\t\t\t\t\t\t\t\t\t<div class=\"decoration\">\n\t\t\t\t\t\t<div class=\"decoration-inside\"><\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n<\/div><\/div><div id=\"panel-gb3701-69eca48e1f4ef-1-0-1\" class=\"so-panel widget widget_sow-editor panel-last-child\" data-index=\"3\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div class=\"teachpress_pub_list\"><form name=\"tppublistform\" method=\"get\" action=\"\"><a name=\"tppubs\" id=\"tppubs\"><\/a><div class=\"teachpress_filter\"><select class=\"default\" name=\"yr\" id=\"yr\" tabindex=\"2\" onchange=\"teachpress_jumpMenu('parent',this, 'https:\/\/gaz.i3a.es\/es\/ruben-gran-tejero\/?')\">\r\n                   <option value=\"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=#tppubs\">Todos los a\u00f1os<\/option>\r\n                   <option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2026#tppubs\" >2026<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2025#tppubs\" >2025<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2024#tppubs\" >2024<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2023#tppubs\" >2023<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2022#tppubs\" >2022<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2021#tppubs\" >2021<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2020#tppubs\" >2020<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2019#tppubs\" >2019<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2018#tppubs\" >2018<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2017#tppubs\" >2017<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2016#tppubs\" >2016<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2015#tppubs\" >2015<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2014#tppubs\" >2014<\/option><option value = \"tgid=&amp;type=&amp;auth=&amp;usr=&amp;yr=2013#tppubs\" >2013<\/option><option value = 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\"tgid=&amp;yr=&amp;auth=&amp;usr=&amp;type=mastersthesis#tppubs\" >Tesis de m\u00e1ster o tesina<\/option><option value = \"tgid=&amp;yr=&amp;auth=&amp;usr=&amp;type=misc#tppubs\" >Miscel\u00e1nea<\/option><option value = \"tgid=&amp;yr=&amp;auth=&amp;usr=&amp;type=phdthesis#tppubs\" >Tesis doctorales<\/option><option value = \"tgid=&amp;yr=&amp;auth=&amp;usr=&amp;type=proceedings#tppubs\" >Actas de congresos<\/option><option value = \"tgid=&amp;yr=&amp;auth=&amp;usr=&amp;type=techreport#tppubs\" >Informes t\u00e9cnicos<\/option><option value = \"tgid=&amp;yr=&amp;auth=&amp;usr=&amp;type=workshop#tppubs\" >Workshops<\/option>\r\n                <\/select><\/div><input type=\"hidden\" name=\"trp-form-language\" value=\"es\"\/><\/form><div class=\"tablenav\"><div class=\"tablenav-pages\"><span class=\"displaying-num\">50 registros<\/span> <a class=\"page-numbers button disabled\">&laquo;<\/a> <a class=\"page-numbers button disabled\">&lsaquo;<\/a> 1 de 10 <a href=\"https:\/\/gaz.i3a.es\/es\/ruben-gran-tejero\/?limit=2&amp;tgid=&amp;yr=&amp;type=&amp;usr=&amp;auth=&amp;tsr=#tppubs\" title=\"p\u00e1gina siguiente\" class=\"page-numbers button\">&rsaquo;<\/a> <a href=\"https:\/\/gaz.i3a.es\/es\/ruben-gran-tejero\/?limit=10&amp;tgid=&amp;yr=&amp;type=&amp;usr=&amp;auth=&amp;tsr=#tppubs\" title=\"\u00faltima p\u00e1gina\" class=\"page-numbers button\">&raquo;<\/a> <\/div><\/div><div class=\"teachpress_publication_list\"><h3 class=\"tp_h3\" id=\"tp_h3_2024\">2024<\/h3><h3 class=\"tp_h3\" id=\"tp_h3_article\">Art\u00edculos de revista<\/h3><div class=\"tp_publication tp_publication_article\"><div class=\"tp_pub_info\"><p class=\"tp_pub_author\"> Toca-D\u00edaz, Yamilka;  Tejero, Rub\u00e9n Gran;  Valero, Alejandro<\/p><p class=\"tp_pub_title\"><a class=\"tp_title_link\" onclick=\"teachpress_pub_showhide('850','tp_links')\" style=\"cursor:pointer;\">Shift-and-Safe: Addressing permanent faults in aggressively undervolted CNN accelerators<\/a> <span class=\"tp_pub_type tp_  article\">Art\u00edculo de revista<\/span> <\/p><p class=\"tp_pub_additional\"><span class=\"tp_pub_additional_in\">En: <\/span><span class=\"tp_pub_additional_journal\">Journal of Systems Architecture, <\/span><span class=\"tp_pub_additional_volume\">vol. 157, <\/span><span class=\"tp_pub_additional_pages\">pp. 1-13, <\/span><span class=\"tp_pub_additional_year\">2024<\/span>, <span class=\"tp_pub_additional_issn\">ISSN: 1383-7621<\/span>.<\/p><p class=\"tp_pub_menu\"><span class=\"tp_abstract_link\"><a id=\"tp_abstract_sh_850\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('850','tp_abstract')\" title=\"Mostrar resumen\" style=\"cursor:pointer;\">Resumen<\/a><\/span> | <span class=\"tp_resource_link\"><a id=\"tp_links_sh_850\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('850','tp_links')\" title=\"Mostrar enlaces y recursos\" style=\"cursor:pointer;\">Enlaces<\/a><\/span> | <span class=\"tp_bibtex_link\"><a id=\"tp_bibtex_sh_850\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('850','tp_bibtex')\" title=\"Mostrar entrada BibTeX \" style=\"cursor:pointer;\">BibTeX<\/a><\/span><\/p><div class=\"tp_bibtex\" id=\"tp_bibtex_850\" style=\"display:none;\"><div class=\"tp_bibtex_entry\"><pre>@article{Toca-D\u00edaz2024,<br \/>\r\ntitle = {Shift-and-Safe: Addressing permanent faults in aggressively undervolted CNN accelerators},<br \/>\r\nauthor = {Yamilka Toca-D\u00edaz and Rub\u00e9n Gran Tejero and Alejandro Valero},<br \/>\r\nurl = {https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1383762124002297},<br \/>\r\ndoi = {https:\/\/doi.org\/10.1016\/j.sysarc.2024.103292},<br \/>\r\nissn = {1383-7621},<br \/>\r\nyear  = {2024},<br \/>\r\ndate = {2024-12-01},<br \/>\r\nurldate = {2024-12-01},<br \/>\r\njournal = {Journal of Systems Architecture},<br \/>\r\nvolume = {157},<br \/>\r\npages = {1-13},<br \/>\r\nabstract = {Underscaling the supply voltage (Vdd) to ultra-low levels below the safe-operation threshold voltage (Vmin) holds promise for substantial power savings in digital CMOS circuits. However, these benefits come with pronounced challenges due to the heightened risk of bitcell permanent faults stemming from process variations in current technology node sizes. This work delves into the repercussions of such faults on the accuracy of a 16-bit fixed-point Convolutional Neural Network (CNN) inference accelerator powering on-chip activation memories at ultra-low Vdd voltages. Through an in-depth examination of fault patterns, memory usage, and statistical analysis of activation values, this paper introduces Shift-and-Safe: two novel and cost-effective microarchitectural techniques exploiting the presence of outlier activation values and the underutilization of activation memories. Particularly, activation outliers enable a shift-based data representation that reduces the impact of faults on the activation values, whereas the memory underutilization is exploited to maintain a safe replica of affected activations in idle memory regions. Remarkably, these mechanisms do not add any burden to the programmer and are independent of application characteristics, rendering them easily deployable across real-world CNN accelerators. Experimental results show that Shift-and-Safe maintains the CNN accuracy even in the presence of almost a quarter of the total activations with faults. In addition, average energy savings are by 5% and 11% compared to the state-of-the-art approach and a conventional accelerator supplied at Vmin, respectively.},<br \/>\r\nkeywords = {},<br \/>\r\npubstate = {published},<br \/>\r\ntppubtype = {article}<br \/>\r\n}<br \/>\r\n<\/pre><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('850','tp_bibtex')\">Cerrar<\/a><\/p><\/div><div class=\"tp_abstract\" id=\"tp_abstract_850\" style=\"display:none;\"><div class=\"tp_abstract_entry\">Underscaling the supply voltage (Vdd) to ultra-low levels below the safe-operation threshold voltage (Vmin) holds promise for substantial power savings in digital CMOS circuits. However, these benefits come with pronounced challenges due to the heightened risk of bitcell permanent faults stemming from process variations in current technology node sizes. This work delves into the repercussions of such faults on the accuracy of a 16-bit fixed-point Convolutional Neural Network (CNN) inference accelerator powering on-chip activation memories at ultra-low Vdd voltages. Through an in-depth examination of fault patterns, memory usage, and statistical analysis of activation values, this paper introduces Shift-and-Safe: two novel and cost-effective microarchitectural techniques exploiting the presence of outlier activation values and the underutilization of activation memories. Particularly, activation outliers enable a shift-based data representation that reduces the impact of faults on the activation values, whereas the memory underutilization is exploited to maintain a safe replica of affected activations in idle memory regions. Remarkably, these mechanisms do not add any burden to the programmer and are independent of application characteristics, rendering them easily deployable across real-world CNN accelerators. Experimental results show that Shift-and-Safe maintains the CNN accuracy even in the presence of almost a quarter of the total activations with faults. In addition, average energy savings are by 5% and 11% compared to the state-of-the-art approach and a conventional accelerator supplied at Vmin, respectively.<\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('850','tp_abstract')\">Cerrar<\/a><\/p><\/div><div class=\"tp_links\" id=\"tp_links_850\" style=\"display:none;\"><div class=\"tp_links_entry\"><ul class=\"tp_pub_list\"><li><i class=\"fas fa-globe\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1383762124002297\" title=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1383762124002297\" target=\"_blank\">https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1383762124002297<\/a><\/li><li><i class=\"ai ai-doi\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/dx.doi.org\/https:\/\/doi.org\/10.1016\/j.sysarc.2024.103292\" title=\"DOI de seguimiento:https:\/\/doi.org\/10.1016\/j.sysarc.2024.103292\" target=\"_blank\">doi:https:\/\/doi.org\/10.1016\/j.sysarc.2024.103292<\/a><\/li><\/ul><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('850','tp_links')\">Cerrar<\/a><\/p><\/div><\/div><\/div><div class=\"tp_publication tp_publication_article\"><div class=\"tp_pub_info\"><p class=\"tp_pub_author\"> Toca-D\u00edaz, Yamilka;  Palacios, Reynier Hern\u00e1ndez;  Tejero, Ruben Gran;  Valero, Alejandro<\/p><p class=\"tp_pub_title\"><a class=\"tp_title_link\" onclick=\"teachpress_pub_showhide('851','tp_links')\" style=\"cursor:pointer;\">Flip-and-Patch: A fault-tolerant technique for on-chip memories of CNN accelerators at low supply voltage<\/a> <span class=\"tp_pub_type tp_  article\">Art\u00edculo de revista<\/span> <\/p><p class=\"tp_pub_additional\"><span class=\"tp_pub_additional_in\">En: <\/span><span class=\"tp_pub_additional_journal\">Microprocessors and Microsystems, <\/span><span class=\"tp_pub_additional_volume\">vol. 106, <\/span><span class=\"tp_pub_additional_pages\">pp. 1-13, <\/span><span class=\"tp_pub_additional_year\">2024<\/span>, <span class=\"tp_pub_additional_issn\">ISSN: 0141-9331<\/span>.<\/p><p class=\"tp_pub_menu\"><span class=\"tp_abstract_link\"><a id=\"tp_abstract_sh_851\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('851','tp_abstract')\" title=\"Mostrar resumen\" style=\"cursor:pointer;\">Resumen<\/a><\/span> | <span class=\"tp_resource_link\"><a id=\"tp_links_sh_851\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('851','tp_links')\" title=\"Mostrar enlaces y recursos\" style=\"cursor:pointer;\">Enlaces<\/a><\/span> | <span class=\"tp_bibtex_link\"><a id=\"tp_bibtex_sh_851\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('851','tp_bibtex')\" title=\"Mostrar entrada BibTeX \" style=\"cursor:pointer;\">BibTeX<\/a><\/span><\/p><div class=\"tp_bibtex\" id=\"tp_bibtex_851\" style=\"display:none;\"><div class=\"tp_bibtex_entry\"><pre>@article{Toca-D\u00edaz2024b,<br \/>\r\ntitle = {Flip-and-Patch: A fault-tolerant technique for on-chip memories of CNN accelerators at low supply voltage},<br \/>\r\nauthor = {Yamilka Toca-D\u00edaz and Reynier Hern\u00e1ndez Palacios and Ruben Gran Tejero and Alejandro Valero},<br \/>\r\nurl = {https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0141933124000188},<br \/>\r\ndoi = {https:\/\/doi.org\/10.1016\/j.micpro.2024.105023},<br \/>\r\nissn = {0141-9331},<br \/>\r\nyear  = {2024},<br \/>\r\ndate = {2024-04-01},<br \/>\r\nurldate = {2024-04-01},<br \/>\r\njournal = {Microprocessors and Microsystems},<br \/>\r\nvolume = {106},<br \/>\r\npages = {1-13},<br \/>\r\nabstract = {Aggressively reducing the supply voltage (Vdd) below the safe threshold voltage (Vmin) can effectively lead to significant energy savings in digital circuits. However, operating at such low supply voltages poses challenges due to a high occurrence of permanent faults resulting from manufacturing process variations in current technology nodes. This work addresses the impact of permanent faults on the accuracy of a Convolutional Neural Network (CNN) inference accelerator using on-chip activation memories supplied at low Vdd below Vmin. Based on a characterization study of fault patterns, this paper proposes two low-cost microarchitectural techniques, namely Flip-and-Patch, which maintain the original accuracy of CNN applications even in the presence of a high number of faults caused by operating at Vdd &lt; Vmin. Unlike existing techniques, Flip-and-Patch remains transparent to the programmer and does not rely on application characteristics, making it easily applicable to real CNN accelerators.<br \/>\r\nExperimental results show that Flip-and-Patch ensures the original CNN accuracy with a minimal impact on system performance (less than 0.05% for every application), while achieving average energy savings of 10.5% and 46.6% in activation memories compared to a conventional accelerator operating at safe and nominal supply voltages, respectively. Compared to the state-of-the-art ThUnderVolt technique, which dynamically adjusts the supply voltage at run time and discarding any energy overhead for such an approach, the average energy savings are by 3.2%.},<br \/>\r\nkeywords = {},<br \/>\r\npubstate = {published},<br \/>\r\ntppubtype = {article}<br \/>\r\n}<br \/>\r\n<\/pre><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('851','tp_bibtex')\">Cerrar<\/a><\/p><\/div><div class=\"tp_abstract\" id=\"tp_abstract_851\" style=\"display:none;\"><div class=\"tp_abstract_entry\">Aggressively reducing the supply voltage (Vdd) below the safe threshold voltage (Vmin) can effectively lead to significant energy savings in digital circuits. However, operating at such low supply voltages poses challenges due to a high occurrence of permanent faults resulting from manufacturing process variations in current technology nodes. This work addresses the impact of permanent faults on the accuracy of a Convolutional Neural Network (CNN) inference accelerator using on-chip activation memories supplied at low Vdd below Vmin. Based on a characterization study of fault patterns, this paper proposes two low-cost microarchitectural techniques, namely Flip-and-Patch, which maintain the original accuracy of CNN applications even in the presence of a high number of faults caused by operating at Vdd &lt; Vmin. Unlike existing techniques, Flip-and-Patch remains transparent to the programmer and does not rely on application characteristics, making it easily applicable to real CNN accelerators.<br \/>\r\nExperimental results show that Flip-and-Patch ensures the original CNN accuracy with a minimal impact on system performance (less than 0.05% for every application), while achieving average energy savings of 10.5% and 46.6% in activation memories compared to a conventional accelerator operating at safe and nominal supply voltages, respectively. Compared to the state-of-the-art ThUnderVolt technique, which dynamically adjusts the supply voltage at run time and discarding any energy overhead for such an approach, the average energy savings are by 3.2%.<\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('851','tp_abstract')\">Cerrar<\/a><\/p><\/div><div class=\"tp_links\" id=\"tp_links_851\" style=\"display:none;\"><div class=\"tp_links_entry\"><ul class=\"tp_pub_list\"><li><i class=\"fas fa-globe\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0141933124000188\" title=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0141933124000188\" target=\"_blank\">https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0141933124000188<\/a><\/li><li><i class=\"ai ai-doi\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/dx.doi.org\/https:\/\/doi.org\/10.1016\/j.micpro.2024.105023\" title=\"DOI de seguimiento:https:\/\/doi.org\/10.1016\/j.micpro.2024.105023\" target=\"_blank\">doi:https:\/\/doi.org\/10.1016\/j.micpro.2024.105023<\/a><\/li><\/ul><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('851','tp_links')\">Cerrar<\/a><\/p><\/div><\/div><\/div><h3 class=\"tp_h3\" id=\"tp_h3_inproceedings\">Proceedings Articles<\/h3><div class=\"tp_publication tp_publication_inproceedings\"><div class=\"tp_pub_info\"><p class=\"tp_pub_author\"> Toca-D\u00edaz, Yamilka;  Tejero, Rub\u00e9n Gran;  Valero, Alejandro<\/p><p class=\"tp_pub_title\"><a class=\"tp_title_link\" onclick=\"teachpress_pub_showhide('852','tp_links')\" style=\"cursor:pointer;\">Ensuring the Accuracy of CNN Accelerators Supplied at Ultra-Low Voltage<\/a> <span class=\"tp_pub_type tp_  inproceedings\">Proceedings Article<\/span> <\/p><p class=\"tp_pub_additional\"><span class=\"tp_pub_additional_in\">En: <\/span><span class=\"tp_pub_additional_pages\">pp. 92-95, <\/span><span class=\"tp_pub_additional_year\">2024<\/span>, <span class=\"tp_pub_additional_isbn\">ISBN: 979-8-3503-8040-8<\/span>.<\/p><p class=\"tp_pub_menu\"><span class=\"tp_abstract_link\"><a id=\"tp_abstract_sh_852\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('852','tp_abstract')\" title=\"Mostrar resumen\" style=\"cursor:pointer;\">Resumen<\/a><\/span> | <span class=\"tp_resource_link\"><a id=\"tp_links_sh_852\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('852','tp_links')\" title=\"Mostrar enlaces y recursos\" style=\"cursor:pointer;\">Enlaces<\/a><\/span> | <span class=\"tp_bibtex_link\"><a id=\"tp_bibtex_sh_852\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('852','tp_bibtex')\" title=\"Mostrar entrada BibTeX \" style=\"cursor:pointer;\">BibTeX<\/a><\/span><\/p><div class=\"tp_bibtex\" id=\"tp_bibtex_852\" style=\"display:none;\"><div class=\"tp_bibtex_entry\"><pre>@inproceedings{Toca-D\u00edaz2024c,<br \/>\r\ntitle = {Ensuring the Accuracy of CNN Accelerators Supplied at Ultra-Low Voltage},<br \/>\r\nauthor = {Yamilka Toca-D\u00edaz and Rub\u00e9n Gran Tejero and Alejandro Valero},<br \/>\r\nurl = {https:\/\/ieeexplore.ieee.org\/document\/10817950},<br \/>\r\ndoi = {https:\/\/doi.org\/10.1109\/ICCD63220.2024.00024},<br \/>\r\nisbn = {979-8-3503-8040-8},<br \/>\r\nyear  = {2024},<br \/>\r\ndate = {2024-11-18},<br \/>\r\nurldate = {2024-11-18},<br \/>\r\njournal = {Proceedings of the 42nd IEEE International Conference on Computer Design (ICCD 2024)},<br \/>\r\npages = {92-95},<br \/>\r\nabstract = {Underscaling the supply voltage (Vdd) to ultra-low levels below the safe-operation threshold voltage (Vmin) brings significant energy savings in digital CMOS circuits but introduces reliability challenges due to increased risk of bitcell permanent faults. This work explores the impact of such faults on the accuracy of a CNN inference accelerator supplying on-chip activation memories at ultra-low Vdd. By examining fault pat-terns, activation values, and memory usage, this paper proposes two microarchitectural techniques exploiting activation outliers and activation memory underutilization. These approaches are cost-effective, do not require programmer intervention, and are application-independent. Experimental results show that the proposed approaches maintain the original CNN accuracy and achieve energy savings by 2.1 % and 8.2 % compared to the state-of-the-art technique and a conventional accelerator supplied at Vmin, respectively, with a negligible impact on the system performance (less than 0.25 %).},<br \/>\r\nkeywords = {},<br \/>\r\npubstate = {published},<br \/>\r\ntppubtype = {inproceedings}<br \/>\r\n}<br \/>\r\n<\/pre><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('852','tp_bibtex')\">Cerrar<\/a><\/p><\/div><div class=\"tp_abstract\" id=\"tp_abstract_852\" style=\"display:none;\"><div class=\"tp_abstract_entry\">Underscaling the supply voltage (Vdd) to ultra-low levels below the safe-operation threshold voltage (Vmin) brings significant energy savings in digital CMOS circuits but introduces reliability challenges due to increased risk of bitcell permanent faults. This work explores the impact of such faults on the accuracy of a CNN inference accelerator supplying on-chip activation memories at ultra-low Vdd. By examining fault pat-terns, activation values, and memory usage, this paper proposes two microarchitectural techniques exploiting activation outliers and activation memory underutilization. These approaches are cost-effective, do not require programmer intervention, and are application-independent. Experimental results show that the proposed approaches maintain the original CNN accuracy and achieve energy savings by 2.1 % and 8.2 % compared to the state-of-the-art technique and a conventional accelerator supplied at Vmin, respectively, with a negligible impact on the system performance (less than 0.25 %).<\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('852','tp_abstract')\">Cerrar<\/a><\/p><\/div><div class=\"tp_links\" id=\"tp_links_852\" style=\"display:none;\"><div class=\"tp_links_entry\"><ul class=\"tp_pub_list\"><li><i class=\"fas fa-globe\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/ieeexplore.ieee.org\/document\/10817950\" title=\"https:\/\/ieeexplore.ieee.org\/document\/10817950\" target=\"_blank\">https:\/\/ieeexplore.ieee.org\/document\/10817950<\/a><\/li><li><i class=\"ai ai-doi\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/dx.doi.org\/https:\/\/doi.org\/10.1109\/ICCD63220.2024.00024\" title=\"DOI de seguimiento:https:\/\/doi.org\/10.1109\/ICCD63220.2024.00024\" target=\"_blank\">doi:https:\/\/doi.org\/10.1109\/ICCD63220.2024.00024<\/a><\/li><\/ul><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('852','tp_links')\">Cerrar<\/a><\/p><\/div><\/div><\/div><h3 class=\"tp_h3\" id=\"tp_h3_2023\">2023<\/h3><h3 class=\"tp_h3\" id=\"tp_h3_inproceedings\">Proceedings Articles<\/h3><div class=\"tp_publication tp_publication_inproceedings\"><div class=\"tp_pub_info\"><p class=\"tp_pub_author\"> Toca-D\u00edaz, Yamilka;  Mu\u00f1oz, Nicol\u00e1s Landeros;  Tejero, Ruben Gran;  Valero, Alejandro<\/p><p class=\"tp_pub_title\"><a class=\"tp_title_link\" onclick=\"teachpress_pub_showhide('853','tp_links')\" style=\"cursor:pointer;\">On Fault-Tolerant Microarchitectural Techniques for Voltage Underscaling in On-Chip Memories of CNN Accelerators<\/a> <span class=\"tp_pub_type tp_  inproceedings\">Proceedings Article<\/span> <\/p><p class=\"tp_pub_additional\"><span class=\"tp_pub_additional_in\">En: <\/span><span class=\"tp_pub_additional_pages\">pp. 138-145, <\/span><span class=\"tp_pub_additional_year\">2023<\/span>, <span class=\"tp_pub_additional_isbn\">ISBN: 979-8-3503-4419-6<\/span>.<\/p><p class=\"tp_pub_menu\"><span class=\"tp_abstract_link\"><a id=\"tp_abstract_sh_853\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('853','tp_abstract')\" title=\"Mostrar resumen\" style=\"cursor:pointer;\">Resumen<\/a><\/span> | <span class=\"tp_resource_link\"><a id=\"tp_links_sh_853\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('853','tp_links')\" title=\"Mostrar enlaces y recursos\" style=\"cursor:pointer;\">Enlaces<\/a><\/span> | <span class=\"tp_bibtex_link\"><a id=\"tp_bibtex_sh_853\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('853','tp_bibtex')\" title=\"Mostrar entrada BibTeX \" style=\"cursor:pointer;\">BibTeX<\/a><\/span><\/p><div class=\"tp_bibtex\" id=\"tp_bibtex_853\" style=\"display:none;\"><div class=\"tp_bibtex_entry\"><pre>@inproceedings{Toca-D\u00edaz2023,<br \/>\r\ntitle = {On Fault-Tolerant Microarchitectural Techniques for Voltage Underscaling in On-Chip Memories of CNN Accelerators},<br \/>\r\nauthor = {Yamilka Toca-D\u00edaz and Nicol\u00e1s Landeros Mu\u00f1oz and Ruben Gran Tejero and Alejandro Valero},<br \/>\r\nurl = {https:\/\/ieeexplore.ieee.org\/document\/10456839},<br \/>\r\ndoi = {https:\/\/doi.org\/10.1109\/DSD60849.2023.00029},<br \/>\r\nisbn = {979-8-3503-4419-6},<br \/>\r\nyear  = {2023},<br \/>\r\ndate = {2023-09-06},<br \/>\r\nurldate = {2023-09-06},<br \/>\r\njournal = {Proceedings of the 26th Euromicro Conference on Digital System Design (DSD 2023)},<br \/>\r\npages = {138-145},<br \/>\r\nabstract = {Aggressively underscaling the supply voltage (Vdd) below the safe voltage (Vmin) margin is an effective solution to attain substantial energy savings. Unfortunately, operating at such low voltages is challenging due to the high number of permanent faults as a result of variations in the manufacturing process of current technology nodes. This work characterizes the impact of permanent faults on the accuracy of a Convolutional Neural Network (CNN) inference accelerator with on-chip activation memories supplied at low Vdd below Vmin. Based on these observations, this paper proposes a couple of low-cost microarchitectural techniques, referred to as flipping and patching, that ensure the accuracy of CNN applications despite the presence of permanent faults. Contrary to prior work, the proposed techniques are transparent to the programmer and do not depend on application characteristics. Experimental results show that the proposed techniques maintain the original CNN accuracy with a minimal impact on system performance (less than 0.05%), while reducing the energy consumption of activation memories by 11.2% and 46.7% compared to those of a conventional accelerator operating at safe and nominal supply voltages, respectively.},<br \/>\r\nkeywords = {},<br \/>\r\npubstate = {published},<br \/>\r\ntppubtype = {inproceedings}<br \/>\r\n}<br \/>\r\n<\/pre><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('853','tp_bibtex')\">Cerrar<\/a><\/p><\/div><div class=\"tp_abstract\" id=\"tp_abstract_853\" style=\"display:none;\"><div class=\"tp_abstract_entry\">Aggressively underscaling the supply voltage (Vdd) below the safe voltage (Vmin) margin is an effective solution to attain substantial energy savings. Unfortunately, operating at such low voltages is challenging due to the high number of permanent faults as a result of variations in the manufacturing process of current technology nodes. This work characterizes the impact of permanent faults on the accuracy of a Convolutional Neural Network (CNN) inference accelerator with on-chip activation memories supplied at low Vdd below Vmin. Based on these observations, this paper proposes a couple of low-cost microarchitectural techniques, referred to as flipping and patching, that ensure the accuracy of CNN applications despite the presence of permanent faults. Contrary to prior work, the proposed techniques are transparent to the programmer and do not depend on application characteristics. Experimental results show that the proposed techniques maintain the original CNN accuracy with a minimal impact on system performance (less than 0.05%), while reducing the energy consumption of activation memories by 11.2% and 46.7% compared to those of a conventional accelerator operating at safe and nominal supply voltages, respectively.<\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('853','tp_abstract')\">Cerrar<\/a><\/p><\/div><div class=\"tp_links\" id=\"tp_links_853\" style=\"display:none;\"><div class=\"tp_links_entry\"><ul class=\"tp_pub_list\"><li><i class=\"fas fa-globe\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/ieeexplore.ieee.org\/document\/10456839\" title=\"https:\/\/ieeexplore.ieee.org\/document\/10456839\" target=\"_blank\">https:\/\/ieeexplore.ieee.org\/document\/10456839<\/a><\/li><li><i class=\"ai ai-doi\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/dx.doi.org\/https:\/\/doi.org\/10.1109\/DSD60849.2023.00029\" title=\"DOI de seguimiento:https:\/\/doi.org\/10.1109\/DSD60849.2023.00029\" target=\"_blank\">doi:https:\/\/doi.org\/10.1109\/DSD60849.2023.00029<\/a><\/li><\/ul><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('853','tp_links')\">Cerrar<\/a><\/p><\/div><\/div><\/div><h3 class=\"tp_h3\" id=\"tp_h3_2022\">2022<\/h3><h3 class=\"tp_h3\" id=\"tp_h3_article\">Art\u00edculos de revista<\/h3><div class=\"tp_publication tp_publication_article\"><div class=\"tp_pub_info\"><p class=\"tp_pub_author\"> Mu\u00f1oz, Nicol\u00e1s Landeros;  Valero, Alejandro;  Tejero, Rub\u00e9n Gran;  Zoni, Davide<\/p><p class=\"tp_pub_title\"><a class=\"tp_title_link\" onclick=\"teachpress_pub_showhide('854','tp_links')\" style=\"cursor:pointer;\">Gated-CNN: Combating NBTI and HCI aging effects in on-chip activation memories of Convolutional Neural Network accelerators<\/a> <span class=\"tp_pub_type tp_  article\">Art\u00edculo de revista<\/span> <\/p><p class=\"tp_pub_additional\"><span class=\"tp_pub_additional_in\">En: <\/span><span class=\"tp_pub_additional_journal\">Journal of Systems Architecture, <\/span><span class=\"tp_pub_additional_volume\">vol. 128, <\/span><span class=\"tp_pub_additional_pages\">pp. 1-13, <\/span><span class=\"tp_pub_additional_year\">2022<\/span>, <span class=\"tp_pub_additional_issn\">ISSN: 1383-7621<\/span>.<\/p><p class=\"tp_pub_menu\"><span class=\"tp_abstract_link\"><a id=\"tp_abstract_sh_854\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('854','tp_abstract')\" title=\"Mostrar resumen\" style=\"cursor:pointer;\">Resumen<\/a><\/span> | <span class=\"tp_resource_link\"><a id=\"tp_links_sh_854\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('854','tp_links')\" title=\"Mostrar enlaces y recursos\" style=\"cursor:pointer;\">Enlaces<\/a><\/span> | <span class=\"tp_bibtex_link\"><a id=\"tp_bibtex_sh_854\" class=\"tp_show\" onclick=\"teachpress_pub_showhide('854','tp_bibtex')\" title=\"Mostrar entrada BibTeX \" style=\"cursor:pointer;\">BibTeX<\/a><\/span><\/p><div class=\"tp_bibtex\" id=\"tp_bibtex_854\" style=\"display:none;\"><div class=\"tp_bibtex_entry\"><pre>@article{Mu\u00f1oz2022,<br \/>\r\ntitle = {Gated-CNN: Combating NBTI and HCI aging effects in on-chip activation memories of Convolutional Neural Network accelerators},<br \/>\r\nauthor = {Nicol\u00e1s Landeros Mu\u00f1oz and Alejandro Valero and Rub\u00e9n Gran Tejero and Davide Zoni},<br \/>\r\nurl = {https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1383762122001072},<br \/>\r\ndoi = {https:\/\/doi.org\/10.1016\/j.sysarc.2022.102553},<br \/>\r\nissn = {1383-7621},<br \/>\r\nyear  = {2022},<br \/>\r\ndate = {2022-07-01},<br \/>\r\nurldate = {2022-07-01},<br \/>\r\njournal = {Journal of Systems Architecture},<br \/>\r\nvolume = {128},<br \/>\r\npages = {1-13},<br \/>\r\nabstract = {Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) are two of the main reliability threats in current technology nodes. These aging phenomena degrade the transistor\u2019s threshold voltage (Vth) over the lifetime of a digital circuit, resulting in slower transistors that eventually lead to a faulty operation when the critical paths become longer than the processor cycle time. Among all the transistors on a chip, the most vulnerable transistors to such wearout effects are those used to implement SRAM storage, since memory cells are continuously degrading. In particular, NBTI ages PMOS cell transistors when a given logic value is stored for a long period (i.e., a long duty cycle), whereas HCI ages NMOS cell transistors not only when the stored value flips but also when it is accessed. This work focuses on mitigating aging in the on-chip SRAM memories of Convolutional Neural Network (CNN) accelerators storing activations. This paper makes two main contributions. At the software level, we quantify the aging induced by current CNN benchmarks with a characterization study of duty cycle, flip, and access patterns in every activation memory cell. Based on the insights from this study, this work proposes a novel microarchitectural technique, Gated-CNN, that ensures a uniform aging degradation of every memory cell. To do so, Gated-CNN exploits power-gating and address rotation techniques tailored to the memory demands and temporal\/spatial localities exhibited by CNN applications, as well as the memory organization and management of CNN accelerators. Experimental results show that, compared to a conventional design, the average Vth degradation savings are at least as much as 49% depending on the type of transistor.},<br \/>\r\nkeywords = {},<br \/>\r\npubstate = {published},<br \/>\r\ntppubtype = {article}<br \/>\r\n}<br \/>\r\n<\/pre><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('854','tp_bibtex')\">Cerrar<\/a><\/p><\/div><div class=\"tp_abstract\" id=\"tp_abstract_854\" style=\"display:none;\"><div class=\"tp_abstract_entry\">Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) are two of the main reliability threats in current technology nodes. These aging phenomena degrade the transistor\u2019s threshold voltage (Vth) over the lifetime of a digital circuit, resulting in slower transistors that eventually lead to a faulty operation when the critical paths become longer than the processor cycle time. Among all the transistors on a chip, the most vulnerable transistors to such wearout effects are those used to implement SRAM storage, since memory cells are continuously degrading. In particular, NBTI ages PMOS cell transistors when a given logic value is stored for a long period (i.e., a long duty cycle), whereas HCI ages NMOS cell transistors not only when the stored value flips but also when it is accessed. This work focuses on mitigating aging in the on-chip SRAM memories of Convolutional Neural Network (CNN) accelerators storing activations. This paper makes two main contributions. At the software level, we quantify the aging induced by current CNN benchmarks with a characterization study of duty cycle, flip, and access patterns in every activation memory cell. Based on the insights from this study, this work proposes a novel microarchitectural technique, Gated-CNN, that ensures a uniform aging degradation of every memory cell. To do so, Gated-CNN exploits power-gating and address rotation techniques tailored to the memory demands and temporal\/spatial localities exhibited by CNN applications, as well as the memory organization and management of CNN accelerators. Experimental results show that, compared to a conventional design, the average Vth degradation savings are at least as much as 49% depending on the type of transistor.<\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('854','tp_abstract')\">Cerrar<\/a><\/p><\/div><div class=\"tp_links\" id=\"tp_links_854\" style=\"display:none;\"><div class=\"tp_links_entry\"><ul class=\"tp_pub_list\"><li><i class=\"fas fa-globe\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1383762122001072\" title=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1383762122001072\" target=\"_blank\">https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1383762122001072<\/a><\/li><li><i class=\"ai ai-doi\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/dx.doi.org\/https:\/\/doi.org\/10.1016\/j.sysarc.2022.102553\" title=\"DOI de seguimiento:https:\/\/doi.org\/10.1016\/j.sysarc.2022.102553\" target=\"_blank\">doi:https:\/\/doi.org\/10.1016\/j.sysarc.2022.102553<\/a><\/li><\/ul><\/div><p class=\"tp_close_menu\"><a class=\"tp_close\" onclick=\"teachpress_pub_showhide('854','tp_links')\">Cerrar<\/a><\/p><\/div><\/div><\/div><\/div><div class=\"tablenav\"><div class=\"tablenav-pages\"><span class=\"displaying-num\">50 registros<\/span> <a class=\"page-numbers button disabled\">&laquo;<\/a> <a class=\"page-numbers button disabled\">&lsaquo;<\/a> 1 de 10 <a href=\"https:\/\/gaz.i3a.es\/es\/ruben-gran-tejero\/?limit=2&amp;tgid=&amp;yr=&amp;type=&amp;usr=&amp;auth=&amp;tsr=#tppubs\" title=\"p\u00e1gina siguiente\" class=\"page-numbers button\">&rsaquo;<\/a> <a href=\"https:\/\/gaz.i3a.es\/es\/ruben-gran-tejero\/?limit=10&amp;tgid=&amp;yr=&amp;type=&amp;usr=&amp;auth=&amp;tsr=#tppubs\" title=\"\u00faltima p\u00e1gina\" class=\"page-numbers button\">&raquo;<\/a> <\/div><\/div><\/div>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div>\n\n\n<p><\/p>","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":3703,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[238,239],"tags":[],"class_list":["post-3701","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-reseacher","category-team"],"_links":{"self":[{"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/posts\/3701","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/comments?post=3701"}],"version-history":[{"count":10,"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/posts\/3701\/revisions"}],"predecessor-version":[{"id":3832,"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/posts\/3701\/revisions\/3832"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/media\/3703"}],"wp:attachment":[{"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/media?parent=3701"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/categories?post=3701"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/gaz.i3a.es\/es\/wp-json\/wp\/v2\/tags?post=3701"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}